NDE-Based Failure Analysis of an LTCC-Eddy Current Sensor Exposed to High Temperature Using 3-D X-Ray μ-CT-Reference-Cited by-同舟云学术

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NDE-Based Failure Analysis of an LTCC-Eddy Current Sensor Exposed to High Temperature Using 3-D X-Ray μ-CT

Published:2023-04-15 Issue:8 Volume:23 Page:8451-8458
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Dutta Chandan¹^ORCID,Kumar Jayendra²^ORCID,Hawaldar Ranjit³^ORCID,Sagar Sarmishtha Palit¹^ORCID,Das Tarun Kumar¹^ORCID

Affiliation:

1. Advanced Materials and Processes (AMP) Division, CSIR-NML, Jamshedpur, India

2. Department of Electronics and Communication Engineering, National Institute of Technology Jamshedpur, Jamshedpur, India

3. Center for Materials for Electronics Technology, Pune, India

Funder

Council for Scientific and Industrial Research (CSIR), India

Department of Science and Technology (DST), India

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/7361/10102602/10064009.pdf?arnumber=10064009

Reference27 articles.

1. Integrated wireless microfluidic liquid sensors based on low temperature co-fired ceramic (LTCC) technology

2. Producing high quality LTCC sensors for ITER in-vessel magnetic diagnostics

3. A High-Performance LC Wireless Passive Pressure Sensor Fabricated Using Low-Temperature Co-Fired Ceramic (LTCC) Technology

4. Wireless Microfluidic Sensor for Metal Ion Detection in Water

5. Fabrication of Microvias for Multilayer LTCC Substrates

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