Author:
Liu Peng,Wu Jigang,You Zhiqiang,Elimu Michael,Wang Weizheng,Cai Shuo
Cited by
7 articles.
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1. Lifecycle Management of Emerging Memories;2024 IEEE European Test Symposium (ETS);2024-05-20
2. Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT;2022 IEEE International Test Conference (ITC);2022-09
3. Defects, Fault Modeling, and Test Development Framework for RRAMs;ACM Journal on Emerging Technologies in Computing Systems;2022-04-28
4. Intermittent Undefined State Fault in RRAMs;2021 IEEE European Test Symposium (ETS);2021-05-24
5. Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory;IEEE Transactions on Emerging Topics in Computing;2021-04-01