The demonstration of low-cost and logic process fully-compatible OTP memory on advanced HKMG CMOS with a newly found dielectric fuse breakdown-Reference-Cited by-同舟云学术

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The demonstration of low-cost and logic process fully-compatible OTP memory on advanced HKMG CMOS with a newly found dielectric fuse breakdown

Published:2015-12 Issue: Volume: Page:
ISSN:
Container-title:2015 IEEE International Electron Devices Meeting (IEDM)
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Author:

Hsieh E. R.,Huang Z. H.,Chung Steve S.,Ke J. C.,Yang C. W.,Tsai C. T.,Yew T. R.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7402013/7409598/07409619.pdf?arnumber=7409619

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bimodal Reconfigurable Memristor and Read-Only Operations Coexisting in HfO_x-Based Stacked Structures;ECS Journal of Solid State Science and Technology;2024-08-01

2. Large Memory Window Antifuse HfO₂-Based One-Resistor and One-OTP NVMs Featuring Excellent Disturbance Tolerance and Robust 200 °C Retention;IEEE Transactions on Electron Devices;2024-04

3. 1-Transistor 1-Source/Channel/Drain-Diode (1T1D) One-Time-Programmable Memory in 14-nm FinFET;IEEE Electron Device Letters;2023-03

4. A High-Density Large-Ratio Fuse Based Oxide Devices for One-time-programmable Memory Applications;2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA);2022-10-28

5. Embedded Flash and EEPROM for Smart IoT;Memories for the Intelligent Internet of Things;2018-04-20

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