Silicon lifecycle management (SLM) with in-chip monitoring
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9405068/9405088/09405187.pdf?arnumber=9405187
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage;Micromachines;2024-06-08
2. Lifecycle Management of Emerging Memories;2024 IEEE European Test Symposium (ETS);2024-05-20
3. Silicon Lifecycle Managements Addressing Reliability, Availability and Serviceability Requirements in HPC/Datacenter and Automotive Systems;IEICE ESS Fundamentals Review;2024-04-01
4. Enabling In-Field Parametric Testing for RISC-V Cores;2023 IEEE International Test Conference (ITC);2023-10-07
5. SLM ISA and Hardware Extensions for RISC-V Processors;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03
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