Silicon lifecycle management (SLM) with in-chip monitoring

Author:

Kashyap Rajesh

Publisher

IEEE

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage;Micromachines;2024-06-08

2. Lifecycle Management of Emerging Memories;2024 IEEE European Test Symposium (ETS);2024-05-20

3. Silicon Lifecycle Managements Addressing Reliability, Availability and Serviceability Requirements in HPC/Datacenter and Automotive Systems;IEICE ESS Fundamentals Review;2024-04-01

4. Enabling In-Field Parametric Testing for RISC-V Cores;2023 IEEE International Test Conference (ITC);2023-10-07

5. SLM ISA and Hardware Extensions for RISC-V Processors;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03

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