When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies-Reference-Cited by-同舟云学术

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When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies

Published:2020-01 Issue: Volume: Page:
ISSN:
Container-title:2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)
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Author:

Yan Zheyu,Shi Yiyu,Liao Wang,Hashimoto Masanori,Zhou Xichuan,Zhuo Cheng

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9036752/9045099/09045134.pdf?arnumber=9045134

Cited by 34 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluating single event upsets in deep neural networks for semantic segmentation: An embedded system perspective;Journal of Systems Architecture;2024-09

2. Algorithm prediction of single particle irradiation effect based on novel TFETs;Nanotechnology;2024-08-22

3. Error-Tolerance-Aware Write-Energy Reduction of MTJ-Based Quantized Neural Network Hardware;IEICE Transactions on Information and Systems;2024-08-01

4. Compute-in-Memory-Based Neural Network Accelerators for Safety-Critical Systems: Worst-Case Scenarios and Protections;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-08

5. On the Asymmetry of Stuck-at Fault Sensitivity in Memristive Neural Architectures;2024 IEEE 8th International Test Conference India (ITC India);2024-07-21

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