Author:
Wang Wendong,Guin Ujjwal,Singh Adit
Cited by
3 articles.
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1. Golden-Free Robust Age Estimation to Triage Recycled ICs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-09
2. Beware of Discarding Used SRAMs: Information is Stored Permanently;2022 IEEE Physical Assurance and Inspection of Electronics (PAINE);2022-10-25
3. Building Hardware Security Primitives Using Scan-based Design-for-Testability;2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS);2022-08-07