Distributed ESD protection for high-speed integrated circuits-Reference-Cited by-同舟云学术

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Distributed ESD protection for high-speed integrated circuits

Published:2000-08 Issue:8 Volume:21 Page:390-392
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Kleveland B.,Maloney T.J.,Morgan I.,Madden L.,Lee T.H.,Wong S.S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/18532/00852960.pdf?arnumber=852960

Cited by 45 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Distributed Protection for High-Speed Wireline Receivers;2023 45th Annual EOS/ESD Symposium (EOS/ESD);2023-10-02

2. Effect of NC pins ESD test on the reliability of integrated circuits with high density BGA package;Microelectronics Reliability;2022-12

3. The triboelectricity of the human body;Nano Energy;2021-08

4. ESD in RF CMOS;The ESD Handbook;2021-03-26

5. ESD RF Design;The ESD Handbook;2021-03-26

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