Author:
Cellere G.,Valentini M.G.,Pantisano L.,Cheung K.P.,Paccagnella A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
8 articles.
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1. Radiation effects on NAND Flash memories;Inside NAND Flash Memories;2010
2. Defects in Thin and Ultrathin Silicon Dioxides;Defects in Microelectronic Materials and Devices;2008-11-19
3. Thermal recovery from stress-induced high-κ dielectric film degradation;Journal of Applied Physics;2007-02-15
4. Effect of deuterium anneal on thin gate oxide reliability;2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005.;2005
5. Screening of Si–H bonds during plasma processing;Solid-State Electronics;2004-10