Author:
Li Mingye,Wang Fangzhou,Gupta Sandeep
Funder
Office of the Director of National Intelligence
Intelligence Advanced Research Projects Activity
Army Research Office
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Built-In Self-Test of SFQ Circuits Using Side-Channel Leakage Information;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-06
2. Built in self test (BIST) for RSFQ circuits;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
3. Results From the ColdFlux Superconductor Integrated Circuit Design Tool Project;IEEE Transactions on Applied Superconductivity;2023-11
4. Josephson Junction Stuck-At Fault Detection in SFQ Circuits;IEEE Transactions on Applied Superconductivity;2023-09
5. Design for testability (DFT) for RSFQ circuits;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24