Charge-based capacitance measurement for bias-dependent capacitance-Reference-Cited by-同舟云学术

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Charge-based capacitance measurement for bias-dependent capacitance

Published:2006-05 Issue:5 Volume:27 Page:390-392
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Yao-Wen Chang ,Hsing-Wen Chang ,Tao-Cheng Lu ,Ya-Chin King ,Wenchi Ting ,Yen-Hui Joseph Ku ,Chih-Yuan Lu

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/34143/01626466.pdf?arnumber=1626466

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