Author:
Narasimham Balaji,Luk Wing K.
Cited by
4 articles.
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1. Hybrid Hardware/Software Detection of Multi-Bit Upsets in Memory;2024 54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W);2024-06-24
2. Twin ECC: A Data Duplication Based ECC for Strong DRAM Error Resilience;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04
3. Exploiting Asymmetry in eDRAM Errors for Redundancy-Free Error-Tolerant Design;IEEE Transactions on Emerging Topics in Computing;2021-10-01
4. Sequential Circuit Implementation Method for Multi-Context Scrubbing Operations on FPGAs;2021 IEEE International Symposium on Circuits and Systems (ISCAS);2021-05