New insights into charging in capacitive RF MEMS switches-Reference-Cited by-同舟云学术

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New insights into charging in capacitive RF MEMS switches

Published:2008-04 Issue: Volume: Page:
ISSN:
Container-title:2008 IEEE International Reliability Physics Symposium
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Author:

Czarnecki P.,Rottenberg X.,Soussan P.,Nolmans P.,Ekkels P.,Muller P.,Tilmans H.A.C.,De Raedt W.,Puers R.,Marchand L.,De Wolf I.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4550747/4558854/04558936.pdf?arnumber=4558936

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of Charge Accumulation Effect in Micro-Shell Resonator Gyroscope;2023 IEEE SENSORS;2023-10-29

2. Preconditioning Procedure for the Better Estimation of the Long-Term Lifetime in Microelectromechanical Switches;IEEE Transactions on Electron Devices;2016-03

3. Transient evolution of mechanical and electrical effects in microelectromechanical switches subjected to long-term stresses;IEEE Transactions on Electron Devices;2015-11

4. RF-MEMS switch design optimization for long-term reliability;Analog Integrated Circuits and Signal Processing;2013-10-31

5. Reliability of RF MEMS;Handbook of Mems for Wireless and Mobile Applications;2013

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