Author:
Kapre R.,Shakeri K.,Puchner H.,Tandigan J.,Nigam T.,Jang K.,Reddy M.V.R.,Lakshminarayanan S.,Sajoto D.,Whately M.
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Ultra-Low Voltage Enablement for Standard Cells with Moment based LVF;2024 25th International Symposium on Quality Electronic Design (ISQED);2024-04-03
2. Extensive Investigation on Even-Transistor-Configuration CMOS-based SRAM;Nanoscale Field Effect Transistors: Emerging Applications;2023-12-19
3. Recoverability effects on reliability assessment for accelerated degradation testing;IISE Transactions;2022-08-02
4. SRAM-Based Memory Operation and Yield;Analog Circuits and Signal Processing;2013-09-03
5. Introduction;Analog Circuits and Signal Processing;2013-09-03