Assigned MURA Defect Generation Based on Diffusion Model-Reference-Cited by-同舟云学术

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Assigned MURA Defect Generation Based on Diffusion Model

Published:2023-06 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
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Author:

Liu Weizhi¹,Liu Chang²,Liu Qiang¹,Yu Dahai¹

Affiliation:

1. TCL Corporate Research (Hong Kong)

2. The University of Hong Kong

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10208270/10208119/10208354.pdf?arnumber=10208354

Reference47 articles.

1. Gans trained by a two time-scale update rule converge to a nash equilibrium;heusel;CoRR,2017

2. Improved training of wasserstein gans;gulrajani;Advances in neural information processing systems,2017

3. Palette: Image-to-Image Diffusion Models

4. Cascaded diffusion models for high fidelity image generation;ho;CoRR,2021

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Machine-Learning Strategy to Detect Mura Defects in a Low-Contrast Image by Piecewise Gamma Correction;Sensors;2024-02-24

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