Determination of Guided Wavelength in Multi-layer Microstrip Structures via Open Circuit T-resonator-Reference-Cited by-同舟云学术

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Determination of Guided Wavelength in Multi-layer Microstrip Structures via Open Circuit T-resonator

Published:2023-11-30 Issue: Volume: Page:1-4
ISSN:
Container-title:2023 14th International Conference on Electrical and Electronics Engineering (ELECO)
language:
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Author:

Oner Gulden Gunay Bulut¹,Basbug Suad¹,Altuncu Yasemin²

Affiliation:

1. Nevsehir Haci Bektas Veli University,Faculty of Engineering-Architecture,Department of Electrical Electronics Engineering,Nevsehir,Turkey

2. Nigde Omer Halisdemir University,Faculty of Engineering,Department of Electrical Electronics Engineering,Nigde,Turkey

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10415861/10415862/10416033.pdf?arnumber=10416033

Reference21 articles.

1. Sensor and Methodology for Determining Dielectric Constant Using Electrically Coupled Resonators

2. Wideband measurement of the dielectric constant of an FR4 substrate using a parallel-coupled microstrip resonator

3. Measurement of dielectric constant using a microstrip ring resonator

4. Material Characterization Using Complementary Split-Ring Resonators

5. Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator

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