Online Evaluation of Power Device Aging during AC Power Cycling-Reference-Cited by-同舟云学术

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Online Evaluation of Power Device Aging during AC Power Cycling

Published:2023-05-12 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE 6th International Electrical and Energy Conference (CIEEC)
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Author:

Wu Lixin¹,Deng Erping²,Wang Yanhao¹,Cao Haiyang³,Huang Yongzhang¹

Affiliation:

1. NCEPU,Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources,Beijing,China,102206

2. School of Electrical Engineering and Automation, HFUT,Hefei,Anhui Province,China,230009

3. Shanghai XPT Technology Limited,Shanghai,China,201805

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10165685/10164836/10166213.pdf?arnumber=10166213

Reference13 articles.

1. Study on Effect of Junction Temperature Swing Duration on Lifetime of Transfer Molded Power IGBT Modules

2. Chenjie. Challenges and analysis of power cycle test technology for power devices. [J];erping;Chinese Journal of Electrical Engineering,2022

3. Model for Power Cycling Lifetime of IGBT Modules: Various Factors in Influencing Lifetime[C];bayerer;Proceedings of the 5th International Conference on Integrated Power Electronics Systems,2008

4. Power cycling capability of silicon low-voltage MOSFETs under different operation conditions

5. Semiconductor devices-discrete devices-part 9: insulated-gate bipolar transistors(IGBTs): IEC 60747–9;International Electrotechnical Commission,2007

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