Measurement of Dielectric Parameters of Small Samples at X-Band Frequencies by Cavity Perturbation Technique-Reference-Cited by-同舟云学术

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Measurement of Dielectric Parameters of Small Samples at X-Band Frequencies by Cavity Perturbation Technique

Published:2005-10 Issue:5 Volume:54 Page:2120-2123
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:en
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Verma A.,Dube D.C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/32442/01514673.pdf?arnumber=1514673

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