Blind Calibration Algorithm for Time-interleaved Analog-to-Digital Conversion System
Author:
Affiliation:
1. Nanjing University of Posts and Telecommunications,College of Integrated Circuit Science and Engineering,Nanjing,China
2. Nanjing GuoBo Electronics Co. Ltd,Nanjing,China
Funder
National Natural Science Foundation of China
State Key Laboratory of Millimeter Waves
Nanjing University of Posts and Telecommunications
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10275796/10276388/10277032.pdf?arnumber=10277032
Reference4 articles.
1. Digital Blind Background Calibration of Imperfections in Time-Interleaved ADCs
2. A Novel Autocorrelation Combined MM-CDR Time-Interleaved ADC Timing Calibration in 28 nm CMOS Technology
3. 27.5 A 4GS/s time-interleaved RF ADC in 65nm CMOS with 4GHz input bandwidth
4. A 12.8 GS/s Time-Interleaved ADC With 25 GHz Effective Resolution Bandwidth and 4.6 ENOB
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