Discovery and Identification of Memory Corruption Vulnerabilities on Bare-Metal Embedded Devices
Author:
Affiliation:
1. imec-DistriNet, KU Leuven, Leuven, Belgium
2. University of Trento, Trento, Italy
Funder
Research Fund KU Leuven
Flemish Research Programme Cybersecurity
EU
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/8858/10068314/09707846.pdf?arnumber=9707846
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