Detection of Defect Density of States in Solution-Processed Quantum Devices-Reference-Cited by-同舟云学术

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Detection of Defect Density of States in Solution-Processed Quantum Devices

Published:2024-03-03 Issue: Volume:69 Page:1-3
ISSN:
Container-title:2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
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Author:

Marothya Himanshu¹,Acharya Vishwas¹,Mondal Sandip¹

Affiliation:

1. IIT Bombay,Department of Electrical Engineering,Mumbai,400076

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10511270/10511310/10511927.pdf?arnumber=10511927

Reference11 articles.

1. Semiconductor quantum dots and related systems: Electronic, optical, luminescence and related properties of low dimensional systems

2. Observation of the "Dark Exciton" in CdSe Quantum Dots

3. Anti-Stokes photoluminescence in colloidal semiconductor quantum dots

4. Anti-Stokes Photoluminescence in II-VI Colloidal Nanocrystals

5. Anti-stokes luminescence of cadmium telluride nanocrystal;Rakovich;J. Appl. Spectrosc.,2002

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