Author:
Chakravadhanula K.,Chickermane V.,Pearl D.,Garg A.,Khurana R.,Mukherjee S.,Nagaraj P.
Cited by
2 articles.
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1. A Hybrid Test Scheme for Automotive IC in Multisite Testing;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12
2. A Framework for Configurable Joint-Scan Design-for-Test Architecture;Journal of Electronic Testing;2021-12