Trapping and Detrapping Mechanisms in β-Ga₂O₃ Vertical FinFETs Investigated by Electro-Optical Measurements-Reference-Cited by-同舟云学术

Trapping and Detrapping Mechanisms in β-Ga₂O₃ Vertical FinFETs Investigated by Electro-Optical Measurements

Published:2020-10 Issue:10 Volume:67 Page:3954-3959
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Fabris Elena^ORCID,De Santi Carlo^ORCID,Caria Alessandro^ORCID,Li Wenshen^ORCID,Nomoto Kazuki,Hu Zongyang^ORCID,Jena Debdeep^ORCID,Xing Huili Grace^ORCID,Meneghesso Gaudenzio^ORCID,Zanoni Enrico,Meneghini Matteo^ORCID

Funder

University of Padova through the “Novel vertical GaN-devices for next generation power conversion,” NoveGaN project, STARS CoG Grants

AFOSR

NSF NNCI Program

MRSEC program

MRI

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

https://ieeexplore.ieee.org/ielam/16/9204488/9169807-aam.pdf

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