A Non-Redundant Latch With Key-Node-Upset Obstacle of Beneficial Efficiency for Harsh Environments Applications
Author:
Affiliation:
1. State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
Funder
National Natural Science Foundation of China (NSFC) Research Project
Shanghai Pujiang Program
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture
Link
http://xplorestaging.ieee.org/ielx7/8919/10089883/10025568.pdf?arnumber=10025568
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1. Built-In Soft Error Resilience for Robust System Design
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