A High Frame Rate Test System for the HEPS-BPIX Based on NI-sbRIO Board-Reference-Cited by-同舟云学术

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A High Frame Rate Test System for the HEPS-BPIX Based on NI-sbRIO Board

Published:2017-06 Issue:6 Volume:64 Page:1316-1319
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Gu Jingzi^ORCID,Zhang Jie,Wei Wei,Ning Zhe,Li Zhenjie,Jiang Xiaoshan,Fan Lei,Shen Wei,Ren Jiayi,Ji Xiaolu,Lan Allan K.,Lu Yunpeng,Ouyang Qun,Liu Peng,Zhu Kejun,Wang Zheng

Funder

State Key Laboratory of Particle Detection and Electronics of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/7959218/07932174.pdf?arnumber=7932174

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research advances on X-ray pixel detectors;Chinese Science Bulletin;2022-06-21

2. The Study of Calibration for the Hybrid Pixel Detector With Single Photon Counting in HEPS-BPIX;IEEE Transactions on Nuclear Science;2021-08

3. Photon Counting Detectors for X-Ray Imaging With Emphasis on CT;IEEE Transactions on Radiation and Plasma Medical Sciences;2021-07

4. The development and application of the test system for the silicon pixel modules in HEPS-BPIX;Radiation Detection Technology and Methods;2020-11-07

5. FPGA implementation of 10 G Ethernet-based DAQ systems for pixel detectors;Radiation Detection Technology and Methods;2019-11-04

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