Criticality based Reliability from Rowhammer Attacks in Multi-User-Multi-FPGA Platform

Author:

Guha Krishnendu1,Chakrabarti Amlan2

Affiliation:

1. University of Florida,Department of Electrical and Computer Engineering,(USA)

2. University of Calcutta,A.K.Choudhury School of Information Technology,(India)

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Read Disturbance in High Bandwidth Memory: A Detailed Experimental Study on HBM2 DRAM Chips;2024 54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN);2024-06-24

2. Spatial Variation-Aware Read Disturbance Defenses: Experimental Analysis of Real DRAM Chips and Implications on Future Solutions;2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA);2024-03-02

3. A Self Aware Security Approach for Real Time Neural Network Applications from Row Hammer Attacks in Multi FPGA Multi User Environment;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

4. Mitigation of Rowhammer Attack on DDR4 Memory: A Novel Multi-Table Frequent Element Algorithm Based Approach;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06

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