Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators-Reference-Cited by-同舟云学术

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Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators

Published:2020-05 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE European Test Symposium (ETS)
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Author:

Ince Mehmet,Ozev Sule

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9125440/9131553/09131577.pdf?arnumber=9131577

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Operational Amplifiers Defect Detection and Localization Using Digital Injectors and Observer Circuits;Electronics;2024-07-21

2. Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

3. Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22

4. Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation;IEEE Design & Test;2023-08

5. Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits;2023-05-11

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