Neutron sensitivity of high voltage SiC devices for avionics applications
Author:
Affiliation:
1. Airbus Defence and Space,Toulouse,France,31025
2. Airbus Operations SAS,Toulouse,France,31060
3. Airbus Defence and Space,Elancourt,France,78996
4. Airbus SAS,Toulouse,France,31025
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9857595/9857677/09857698.pdf?arnumber=9857698
Reference13 articles.
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3. Analysis of neutron-induced single-event burnout in SiC power MOSFETs
4. Preliminary results ofChipIr, a new atmospheric-like neutron beamline for irradiation of microelectronics;cazzaniga;Proceeding of theSELSE-13 “The 13th Workshop on S ilicon Errors in Logic - S ystem Effects ”,0
5. Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment;Equipment IEC Tech Std,2016
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