World-most energy-efficient MRAM technology for non-volatile RAM applications

Author:

Lee T. Y.1,Lee J. M.1,Kim M. K.1,Oh J. S.1,Lee J. W.2,Jeong H. M.1,Jang P. H.1,Joo M. K.1,Suh K.1,Han S. H.1,Jeong D.-E.2,Kai T.2,Jeong J. H.2,Park J.-H.2,Lee J. H.2,Park Y. H.1,Chang E. B.1,Park Y. K.1,Shin H. J.1,Ji Y. S.1,Hwang S. H.1,Nam K. T.1,Kwon B. S.1,Cho M. K.1,Seo B. Y.1,Song Y. J.1,Koh G. H.1,Lee K.1,Lee J.-H.1,Jeong G. T.1

Affiliation:

1. Samsung Electronics Co.,Foundry Business,Giheung,Korea

2. Samsung Electronics Co.,R&D center,Hwasung,Korea

Publisher

IEEE

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Micromagnetic modeling of double spin-torque magnetic tunnel junction devices;Physica B: Condensed Matter;2024-09

2. On Error Correction for Nonvolatile Processing-In-Memory;2024 ACM/IEEE 51st Annual International Symposium on Computer Architecture (ISCA);2024-06-29

3. MBIST-based weak bit screening method for embedded MRAM;2024 IEEE European Test Symposium (ETS);2024-05-20

4. Field-Free Perpendicular Magnetization Switching of SOT-MRAM Devices by Magnetic Spin Hall Effect;2024 47th MIPRO ICT and Electronics Convention (MIPRO);2024-05-20

5. Measurement-driven neural-network training for integrated magnetic tunnel junction arrays;Physical Review Applied;2024-05-14

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