An analytical model of the RF impedance change due to solder joint cracking

Author:

Azarian Michael H.,Lando Emile,Pecht Michael

Publisher

IEEE

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. DDR4 Ball Grid Array Package Intermittent Fracture Effect on Signal Integrity;IEEE Transactions on Components, Packaging and Manufacturing Technology;2023-01

2. A System Concept for Embedded Condition Monitoring of Electronic Sensor Modules;2022 6th International Conference on System Reliability and Safety (ICSRS);2022-11-23

3. Low-cost, compact, and reconfigurable antennas using complementary split-ring resonator metasurface for next-generation communication systems;International Journal of Microwave and Wireless Technologies;2022-10-11

4. DDR4 BER Degradation Due to Crack in FBGA Package Solder Ball;Electronics;2021-06-16

5. Quantification of Performance Variation and Crack Evolution of Bond-Wire Interconnects Under Harsh Temperature Environments by S-Parameter Analysis;IEEE Transactions on Components, Packaging and Manufacturing Technology;2021-06

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