Author:
Wilcox Edward P.,Phillips Stanley D.,Cressler John D.,Marshall Paul W.,Carts Martin A.,Pellish Jonathan A.,Richmond Larry,Mathes William,Randall Barbara,Post Devon,Gilbert Barry,Daniel Erik
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
3 articles.
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1. Introduction;Research on the Radiation Effects and Compact Model of SiGe HBT;2017-10-24
2. An Investigation of Single-Event Effects and Potential SEU Mitigation Strategies in Fourth-Generation, 90 nm SiGe BiCMOS;IEEE Transactions on Nuclear Science;2013-12
3. Radiation Effects in SiGe Technology;IEEE Transactions on Nuclear Science;2013-06