11 2008 676 676 4666783 10.1109/TSM.2008.2008790 http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=4666783 <![CDATA[Analysis of Read Current and Write Trip Voltage Variability From a 1-MB SRAM Test Structure</span></p> <div class="article-info mt30 clearfix"> <ul> <li> <div> <span class="font-bold">Published:</span><span class="pl10 color-gray2"><span id="ContentPlaceHolder1_Labelpublished">2008-11</span></span> <span class="pl20 font-bold">Issue:</span><span class="pl10 color-gray2"><span id="ContentPlaceHolder1_Labelissue">4</span></span> <span class="pl20 font-bold">Volume:</span><span class="pl10 color-gray2"><span id="ContentPlaceHolder1_Labelvolume">21</span></span> <span class="pl20 font-bold">Page:</span><span class="pl10 color-gray2"><span id="ContentPlaceHolder1_Labelpage">534-541</span></span> </div> </li> <li> <div><span class="font-bold">ISSN:</span><span class="pl10 color-gray2"><span id="ContentPlaceHolder1_LabelISSN">0894-6507</span></span></div> </li> <li> <div><span class="font-bold">Container-title:</span><span class="pl10 color-orange"><span id="ContentPlaceHolder1_Labelcontainertitle">IEEE Transactions on Semiconductor Manufacturing</span></span></div> </li> <li> <div><span class="font-bold">language:</span><span class="pl10 color-gray2"><span id="ContentPlaceHolder1_Labellanguage"></span></span></div> </li> <li> <div><span class="font-bold">Short-container-title:</span><span class="pl10 color-gray2"><span id="ContentPlaceHolder1_Labelshortcontainertitle">IEEE Trans. Semicond. Manufact.</span></span></div> <div></div> </li> </ul> </div> <div id="ContentPlaceHolder1_divAuthor" class="author mt30"> <p class="font-bold">Author:</p> <div id="ContentPlaceHolder1_divAuthor1" class="author-item mt10"><span>Fischer Thomas</span>,<span>Amirante Ettore</span>,<span>Huber Peter</span>,<span>Nirschl Thomas</span>,<span>Olbrich Alexander</span>,<span>Ostermayr Martin</span>,<span>Schmitt-Landsiedel Doris</span></div> </div> <div id="ContentPlaceHolder1_divPublisher" class="publisher mt40"> <p class="font-bold font20">Publisher</p> <p class="color-gray2 mt10"> <span id="ContentPlaceHolder1_Labelpublisher">Institute of Electrical and Electronics Engineers (IEEE)</span> </p> </div> <div id="ContentPlaceHolder1_divSubject" class="subject mt40"> <p class="font-bold font20">Subject</p> <p id="ContentPlaceHolder1_divSubject2" class="color-gray2 mt10">Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials</p> </div> <div id="ContentPlaceHolder1_divLink" class="link mt40"> <p class="font-bold font20">Link</p> <p id="ContentPlaceHolder1_divLink2" class="link-item color-gray2 mt10"><a href="http://xplorestaging.ieee.org/ielx5/66/4657422/04657436.pdf?arnumber=4657436" target="_blank">http://xplorestaging.ieee.org/ielx5/66/4657422/04657436.pdf?arnumber=4657436</a></p> </div> <div id="ContentPlaceHolder1_divCited" class="cited mt40"> <p class="font-bold font20">Cited by<span class="reference-num"> <span id="ContentPlaceHolder1_LabelCitedcount">23</span> articles.</span> <span class="reference-num"> <a onclick="return confirm('您确定要订阅此论文施引文献吗？');" id="ContentPlaceHolder1_LinkButton3" class="mr15 color-wit line-h pl10 bg-red" href="javascript:__doPostBack('ctl00$ContentPlaceHolder1$LinkButton3','')">订阅此论文施引文献</a> <span id="ContentPlaceHolder1_Label3">订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献</span> <span id="ContentPlaceHolder1_lbMsg"></span> </span> </p> <div id="ContentPlaceHolder1_divCited2" class="reference-item color-gray2 mt10"><p>1. <a href="/WebPortal/ArticleView?wd=F1EFD2446D07E5DE1B5D0F5B7F220CA6F55EC0DF76F9A12F8C69DA6BACC308F0" target="_blank">A Threshold Voltage Deviation Monitoring Scheme of Bit Transistors in 6T SRAM for Manufacturing Defects Detection</a>;IEEE Transactions on Semiconductor Manufacturing;2024-05</p><p>2. <a href="/WebPortal/ArticleView?wd=4C5A8D0827CA78F7E01909851ECA467D226EE6C3ADF853602899F3A76E441C48" target="_blank">A robust radiation resistant SRAM cell for space and military applications</a>;Integration;2024-05</p><p>3. <a href="/WebPortal/ArticleView?wd=4C5A8D0827CA78F7F687FF936478635C56F63624F74FD6EC50DE034F5A4AD21A" target="_blank">An efficient radiation hardening SRAM cell to mitigate single and double node upset soft errors</a>;Microelectronics Reliability;2024-01</p><p>4. <a href="/WebPortal/ArticleView?wd=4C5A8D0827CA78F74C4513927110B2E0728216C595BDA5D5FCDC88252E5EBF60" target="_blank">A soft error upset hardened 12T-SRAM cell for space and terrestrial applications</a>;Memories - Materials, Devices, Circuits and Systems;2023-12</p><p>5. <a href="/WebPortal/ArticleView?wd=F1EFD2446D07E5DE1239C8E999B0F4E17D6E27EBAD8FB640E9A8641E9B3DBBEDECBF0DE2C4B011F0" target="_blank">SRAM Vmin Scaling via Negative Wordline</a>;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06</p></div> </div> </div> </div>   </div> <input type="hidden" name="ctl00$ContentPlaceHolder1$HiddenField1" id="ContentPlaceHolder1_HiddenField1" value="F1EFD2446D07E5DE89EB2894E392384F7458122A29EFF183E7ADDB4CF1DB119D" /> </td> </tr> </table> </td> </tr> <tr> <td>  <div class="box100 foot "> <div class="box1200 mau clearfix"> <div class="pt20 pb20 font24">同舟云学术</div> <div class="fl box50"> <div class="box100 clearfix"> <p class="foot-tip fl mr15 fun-btn"><span>1.学者识别</span>学者识别</p> <p class="foot-tip fl mr15 fun-btn"><span>2.学术分析</span>学术分析</p> <p class="foot-tip fl mr15 fun-btn"><span>3.人才评估</span>人才评估</p> </div> <p class="font12 pr40 pt20 pb20 color-gray">"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811<span style="font-size:0px;color:white">{复制后删除}</span>0370</p> <p class="color-gray"><b><a href="/">www.globalauthorid.com</a></b></p> </div> <div class="fr qerbox "> <p class="color-blue text-center pt20 pb10">TOP</p> <a href="#top" class="btn-top mau"><img src="/images/top.png" alt=""></a> </div> <div class="fr qerbox mr15"><img src="/images/code_web.png" alt=""></div> </div> <p class="pt20 pb20 text-center">Copyright © 2019-2024 北京同舟云网络信息技术有限公司<br> <a href="http://www.beian.gov.cn/portal/registerSystemInfo?recordcode=11010802033243" target="_blank">京公网安备11010802033243号</a> <a href="https://beian.miit.gov.cn/#/Integrated/index" target="_blank">京ICP备18003416号-3</a></p> </div>  </td> </tr> </table> </form> </body> </html>