Author:
Diniz Joao P.,Wong Chu-Pan,Kastner Christian,Figueiredo Eduardo
Cited by
3 articles.
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1. Optimal Second-Order Mutants Reduction Based on MOEA/D;2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security Companion (QRS-C);2023-10-22
2. Do Mutations of Strongly Subsuming Second-Order Mutants Really Mask Each Other?;2023 IEEE 34th International Symposium on Software Reliability Engineering (ISSRE);2023-10-09
3. A Systematic Literature Review on Solutions of Mutation Testing Problems;2023 IEEE 8th International Conference On Software Engineering and Computer Systems (ICSECS);2023-08-25