Aggressively Scaled Strained-Silicon-on-Insulator Undoped-Body High- $\kappa$/Metal-Gate nFinFETs for High-Performance Logic Applications-Reference-Cited by-同舟云学术

Aggressively Scaled Strained-Silicon-on-Insulator Undoped-Body High- $\kappa$/Metal-Gate nFinFETs for High-Performance Logic Applications

Published:2011-06 Issue:6 Volume:32 Page:713-715
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Maitra Kingsuk,Khakifirooz Ali,Kulkarni Pranita,Basker Veeraraghavan S.,Faltermeier Jonathan,Jagannathan Hemanth,Adhikari Hemant,Yeh Chun-Chen,Klymko Nancy R.,Saenger Katherine,Standaert Theodorus,Miller Robert J.,Doris Bruce,Paruchuri Vamsi K.,McHerron Dale,O'Neil James,Leobundung Effendi,Bu Huiming

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/5772135/05756638.pdf?arnumber=5756638

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