Author:
Rajski J.,Tyszer J.,Mrugalski G.,Wu-Tung Cheng ,Mukherjee N.,Kassab M.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
26 articles.
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2. Design and Performance Comparison of X-Masking Models in DFT Applications;2023 8th International Conference on Communication and Electronics Systems (ICCES);2023-06-01
3. DIST: Deterministic In-System Test with X-masking;2022 IEEE International Test Conference (ITC);2022-09
4. X-Masking for In-System Deterministic Test;2022 IEEE European Test Symposium (ETS);2022-05-23
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