LFSR-Reseeding Scheme Achieving Low-Power Dissipation During Test-Reference-Cited by-同舟云学术

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LFSR-Reseeding Scheme Achieving Low-Power Dissipation During Test

Published:2007-02 Issue:2 Volume:26 Page:396-401
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Lee Jinkyu,Touba Nur A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx5/43/4068913/04068924.pdf?arnumber=4068924

Cited by 59 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Test Compression for Launch-on-Capture Transition Fault Testing;ACM T DES AUTOMAT EL;2024

2. Design and Analysis of Non-vulnerable PRBS Generation with Internal Shift and XOR of LFSR;Lecture Notes in Electrical Engineering;2024

3. Performance Analysis of a New Low Power BIST Technique in VLSI Circuit by Reducing the Input Vectors;2023 6th International Conference on Electrical Information and Communication Technology (EICT);2023-12-07

4. Switch Controlled State Skipping Based Memory Efficient Test Pattern Generator for BIST Application;2023 Second International Conference on Advances in Computational Intelligence and Communication (ICACIC);2023-12-07

5. Test Compression for Launch-on-Capture Transition Fault Testing;ACM Transactions on Design Automation of Electronic Systems;2023-11-15

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