Author:
Udar Snehal,Kagaris Dimitri
Cited by
9 articles.
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1. Improving of Fault Diagnosis Ability by Test Point Insertion and Output Compaction;2023 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2023-06-25
2. Diagnostic Test Point Insertion and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02
3. Testing and Fault-Localization Solutions for Monolithic 3D ICs;2021 IEEE International Test Conference in Asia (ITC-Asia);2021-08-18
4. Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT Techniques;2019 IEEE International Test Conference in Asia (ITC-Asia);2019-09
5. Improving the Diagnosability of Scan Chain Faults Under Transparent-Scan by Observation Points;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2018-06