Author:
Novikov Alexander A.,Pechenkin Alexander A.,Chumakov Alexander I.,Akhmetov Alexey O.,Mavritskii Oleg B.
Cited by
5 articles.
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1. Investigation and Simulation of SEL Cross Sections at Different Temperatures;IEEE Transactions on Nuclear Science;2022-07
2. Methods of catastrophic failure prevention during the SEL-sensitivity estimation of IC;2022 Moscow Workshop on Electronic and Networking Technologies (MWENT);2022-06-09
3. Methodical Approach for SEL Tolerance Confirmation of CMOS ICs at Low Temperatures;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09
4. Automation of Laser Single-Event Effect Testing of Integrated Circuits for Space Missions;2021 International Siberian Conference on Control and Communications (SIBCON);2021-05-13
5. Investigation of SEE Breakdown in CCD Image Sensor;2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2018-09