Circuit Reliability Analysis Using Signal Reliability Correlations
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8004065/8004274/08004310.pdf?arnumber=8004310
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach;Journal of Electronic Testing;2024-05-28
2. A Framework for Reliability Analysis of Combinational Circuits Using Approximate Bayesian Inference;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-04
3. Accurate Reliability Boundary Evaluation of Approximate Arithmetic Circuit;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-10
4. An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation;Journal of Electronic Testing;2022-04
5. Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal Probability;2021 IEEE International Test Conference in Asia (ITC-Asia);2021-08-18
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