Dielectric breakdown of polyimide films: Area, thickness and temperature dependence-Reference-Cited by-同舟云学术

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Dielectric breakdown of polyimide films: Area, thickness and temperature dependence

Published:2010-02 Issue:1 Volume:17 Page:18-27
ISSN:1070-9878
Container-title:IEEE Transactions on Dielectrics and Electrical Insulation
language:
Short-container-title:IEEE Trans. Dielect. Electr. Insul.

Author:

Diaham S.,Zelmat S.,Locatelli M.-L.,Dinculescu S.,Decup M.,Lebey T.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/94/5411991/05411997.pdf?arnumber=5411997

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