A novel method for the insulation thickness design of HV XLPE cable based on electrical treeing tests
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/94/6877964/06877980.pdf?arnumber=6877980
Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Surface degradation of epoxy resin exposed to corona discharge under bipolar square wave field: From phenomenon to the insights;Polymer Degradation and Stability;2024-10
2. Impact of step voltage parameters on accuracy of evaluating XLPE insulation DC voltage endurance coefficient;IET Generation, Transmission & Distribution;2023-09-25
3. Optimal Content Selection of Voltage Stabilizers Using TOPSIS Method to Achieve Enhanced Material Properties for HVDC Cable Insulation Applications;IEEE Transactions on Dielectrics and Electrical Insulation;2023-02
4. Microcontroller-based aging test system design and implementation for medium voltage cables;Electric Power Systems Research;2023-01
5. A Mathematical Modeling Approach to Characterize the Growth of the Electrical Tree in XLPE Insulation Under Lightning Impulse Overvoltage;Arabian Journal for Science and Engineering;2022-03-22
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