The measurement of very low conductivity and dielectric loss in XLPE cables: a possible method to detect degradation due to thermal aging-Reference-Cited by-同舟云学术

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The measurement of very low conductivity and dielectric loss in XLPE cables: a possible method to detect degradation due to thermal aging

Published:2011-10 Issue:5 Volume:18 Page:1544-1553
ISSN:1070-9878
Container-title:IEEE Transactions on Dielectrics and Electrical Insulation
language:
Short-container-title:IEEE Trans. Dielect. Electr. Insul.

Author:

Fothergill J.,Dodd S.,Dissado L.,Liu T.,Nilsson U.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/94/6032798/06032823.pdf?arnumber=6032823

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