Analysis of conditioning and damaging process in vacuum based on breakdown probability distribution-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Analysis of conditioning and damaging process in vacuum based on breakdown probability distribution

Published:2016-02 Issue:1 Volume:23 Page:43-48
ISSN:1070-9878
Container-title:IEEE Transactions on Dielectrics and Electrical Insulation
language:
Short-container-title:IEEE Trans. Dielect. Electr. Insul.

Author:

Kojima H.,Otake Y.,Takahashi T.,Hayakawa N.,Hasegawa K.,Saito H.,Sakaki M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/94/7422533/7422588.pdf?arnumber=7422588

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Voltage-assisted 3D printing of polymer composite dielectric films with low energy loss and high energy storage density;Journal of Power Sources;2024-07

2. Regulation of uniformity and electric field distribution achieved highly energy storage performance in PVDF-based nanocomposites via continuous gradient structure;Chinese Chemical Letters;2024-03

3. Adjustment Method of Optimum Breakdown Charge during Impulse Voltage Conditioning Process for Vacuum Interrupter;IEEE Transactions on Dielectrics and Electrical Insulation;2024

4. Prediction Method of Breakdown Voltage Probability Distribution Considering Area Effect for Shield Gaps in Vacuum Interrupter;IEEE Transactions on Dielectrics and Electrical Insulation;2023-12

5. Preparation and improved energy storage capability of nanocomposites utilizing ultrathin 2D HfO₂@TiO₂ nanosheets;Journal of Advanced Dielectrics;2023-11-15

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP