Electrical properties of field grading materials influenced by the silicon carbide grain size-Reference-Cited by-同舟云学术

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Electrical properties of field grading materials influenced by the silicon carbide grain size

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Container-title:ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)
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Author:

Onneby C.,Martensson E.,Gafvert U.,Gustafsson A.,Palmqvist L.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/7584/20667/00955507.pdf?arnumber=955507

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