Using Optical Emission Analysis for Estimating Contribution to Power Analysis-Reference-Cited by-同舟云学术

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Using Optical Emission Analysis for Estimating Contribution to Power Analysis

Published:2009-09 Issue: Volume: Page:
ISSN:
Container-title:2009 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)
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Author:

Skorobogatov Sergei

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5412677/5412840/05412850.pdf?arnumber=5412850

Cited by 32 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Exploring Security of Embedded SRAM in PIC and RISC-V Chips: Insights from Image Processing of Low-Cost Photon Emission Microscopy;2023 IEEE Physical Assurance and Inspection of Electronics (PAINE);2023-10-24

2. Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations;Journal of Cryptographic Engineering;2023-10-03

3. Target Preparation Methodology for Semi-Invasive Attacks on Microcontrollers;2022 IEEE Physical Assurance and Inspection of Electronics (PAINE);2022-10-25

4. Evaluation of Magnetoimpedance in Narrow NiFe/Al/NiFe Thin Films for Secured Packaging;IEEE Transactions on Magnetics;2022-02

5. Quiescent photonics side channel analysis: Low cost SRAM readout attack;Cryptography and Communications;2021-01-19

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