Research on SiPIN Detection Efficiency Calibration
Author:
Affiliation:
1. Chengdu University of Technology, National Instituete of Metrology,Chengdu,China
2. National Instituete of Metrology,Beijing,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10269800/10269827/10270334.pdf?arnumber=10270334
Reference16 articles.
1. Bragg diffraction in an atomic lattice bound by light;ller;Physical Review Letters,1995
2. Experimental study on monochromaticity of 30~160 keV single energy X-ray device;wang;ACTA Metrologica Sinica,2021
3. Monoenergetic X-rays radiation facility based on double crystal monochromator;wang;Modern Applied Physics,2021
4. The application of synchrotron radiation to microprobe trace-element analysis of biological samples
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