Comparison of silicon density standards at NRLM and IMGC-Reference-Cited by-同舟云学术

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Comparison of silicon density standards at NRLM and IMGC

Published:1993-04 Issue:2 Volume:42 Page:242-246
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Peuto A.M.,Sacconi A.,Mosca M.,Fujii K.-I.,Tanaka M.,Nezu Y.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx1/19/6913/00278557.pdf?arnumber=278557

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Experimental testing of a prototype cantilevered liquid-nitrogen-cooled silicon mirror;Journal of Synchrotron Radiation;2023-01-01

2. Precision density measurements of solid materials by hydrostatic weighing;Measurement Science and Technology;2006-08-25

3. Mass measurement of 1 kg silicon spheres to establish a density standard;Metrologia;2004-03-24

4. Determination of the amount of gas adsorption on SiO2/Si(100) surfaces to realize precise mass measurement;Metrologia;2004-02-20

5. Bilateral comparisons of hydrometer calibrations between the IMGC-LNE and the IMGC-MIKES;Metrologia;2000-04

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