Extraordinary Permittivity Characterization Using 4H-SiC Substrate-Integrated-Waveguide Resonators
Author:
Affiliation:
1. Cornell University,Ithaca,NY,USA
2. Anritsu Company,Morgan Hill,CA,USA
3. University of Notre Dame,South Bend,IN,USA
Funder
National Science Foundation
Office of Naval Research
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10148649/10148869/10148877.pdf?arnumber=10148877
Reference16 articles.
1. Single-Sweep vs. Banded Characterizations of a D-band Ultra-Low-Loss SiC Substrate-Integrated Waveguide
2. Algorithm for Resonator Parameter Extraction From Symmetrical and Asymmetrical Transmission Responses
3. A multiline method of network analyzer calibration
4. LRM and LRRM Calibrations with Automatic Determination of Load Inductance
5. Substrate-integrated waveguides for monolithic integrated circuits above 110 GHz;asadi;IEEE MTT-S Int Microw Symp,2021
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