BAFLineDP: Code Bilinear Attention Fusion Framework for Line- Level Defect Prediction
Author:
Affiliation:
1. College of Mathematics and Informatics, South China Agricultural University,Guangzhou,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10589599/10589610/10589784.pdf?arnumber=10589784
Reference49 articles.
1. Semi-supervised Software Defect Prediction Model Based on Tri-training
2. Survey on software defect prediction techniques;Thota;International Journal of Applied Science and Engineering,2020
3. Revisiting common bug prediction findings using effort-aware models
4. Revisiting code ownership and its relationship with software quality in the scope of modern code review
5. The Effects of Over and Under Sampling on Fault-prone Module Detection
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