Optical Limiting Sensor Based on Multilayer Optimization of Ag/VO<sub>2</sub> Phase Change Material-Reference-Cited by-同舟云学术

Optical Limiting Sensor Based on Multilayer Optimization of Ag/VO₂ Phase Change Material

Published:2023-09 Issue:9 Volume:7 Page:1-3
ISSN:2475-1472
Container-title:IEEE Sensors Letters
language:
Short-container-title:IEEE Sens. Lett.

Author:

Baratto C.¹^ORCID,Gandolfi M.¹^ORCID,Tognazzi A.²^ORCID,Franceschini P.¹^ORCID,Ambrosio G.¹^ORCID,Li B.³,Morales R. Camacho³^ORCID,de Ceglia D.¹^ORCID,Cino A. C.⁴^ORCID,Neshev D. N.³^ORCID,De Angelis C.¹^ORCID

Affiliation:

1. CNR-INO (National Institute of Optics) PRISM Lab, Brescia, Italy

2. Department of Information Engineering, University of Brescia, Brescia, Italy

3. ARC Centre of Excellence for Transformative Meta-Optical Systems (TMOS), Research School of Physics, The Australian National University, Canberra, Australia

4. Department of Engineering, University of Palermo, Palermo, Italy

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/7782634/10214959/10198539.pdf?arnumber=10198539

Reference15 articles.

1. Raman study of the phase transition in VO2 thin films

2. On the Optical Properties of Thin‐Film Vanadium Dioxide from the Visible to the Far Infrared

3. Opto-thermal dynamics of thin-film optical limiters based on the VO₂ phase transition

4. Unveiling the Role of VO ₂ (B) Polymorph in the Insulator–Metal Transition of VO ₂ (M1) Thin Films

5. Light-Assisted Resistance Collapse in a V2O3 -Based Mott-Insulator Device

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