Fault Attack Investigation on TaO<sub>x</sub> Resistive-RAM for Cyber Secure Application-Reference-Cited by-同舟云学术

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Fault Attack Investigation on TaO_x Resistive-RAM for Cyber Secure Application

Published:2023-08 Issue:8 Volume:70 Page:4170-4177
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Kumar Ankit¹^ORCID,Degraeve Robin²^ORCID,Beckers Arthur²,Fantini Andrea¹,Verbauwhede Ingrid²^ORCID,Linten Dimitri¹,Kar Gouri S.¹

Affiliation:

1. IMEC, Leuven, Belgium

2. KU Leuven, Leuven, Belgium

Funder

Cyber Security Research Flanders

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/10194493/10175197.pdf?arnumber=10175197

Reference24 articles.

1. Characterization of EM faults on ATmega328p

2. OxRRAM-Based Analog in-Memory Computing for Deep Neural Network Inference: A Conductance Variability Study

3. First-principles simulation of oxygen diffusion in HfOx: Role in the resistive switching mechanism

4. Hourglass concept for RRAM: A dynamic and statistical device model

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